Benjamin Kedem
Department of Mathematics
Email Address:
bnk@math.umd.edu
Web address:
http://www.math.umd.edu/~bnk/
Research team:
http://www.math.umd.edu/~bnk/RIT/RIT_TimeSeries.html
Research interests: Time series analysis, spatial
prediction, combination of information from many sources.
Selected publications:
Books:
1. Kedem, B. (1980). Binary Time Series. Lecture
Notes in Pure and Applied Mathematics, Vol. 52, Marcel Dekker, NY.
2. Kedem, B. (1994). Time Series Analysis by
Higher Order Crossings, IEEE Press, Piscataway, NJ.
3. Kedem, B. and Fokianos, K. (2002). Regression
Models for Time Series Analysis, Wiley, NY.
Papers:
Kedem, B. (1980). Estimation of the Parameters in
Stationary Autoregressive Processes After Hard Limiting. Journal of the
American Statistical Association, 75, 146-153.
Kedem, B. and Slud, E. (1982). Time Series Discrimination by Higher Order Crossings. Annals of Statistics, 10, 786-794.
Kedem, B. (1984). On the Sinusoidal Limit of
Stationary Time Series. Annals of Statistics, 12, 665-674.
Kedem, B. (1986). Spectral Analysis and
Discrimination by Zero-Crossings. Proceedings of the IEEE, 74, 1475-1493.
Kedem, B. and Chiu, L. (1987). On the lognormality
of rain rate. Proc. National Acad. Sci., USA, 84, 901-905.
He, S. and Kedem, B. (1990). Convergence of the
zero-crossing rate of autoregressive processes and its link to unit roots. Jour. of Time Series Analysis, 11, 201-213.
Kedem, B. and Li, T-H. (1991). Monotone gain,
first-order autocorrelation, and expected zero-crossing rate. Annals of
Statistics, 19, 1672-1676.
Kedem, B. and Pavlopoulos, H. (1991). On the
threshold method for rainfall estimation: choosing an optimal threshold
level. Journal of the American Statistical Association}, 86, 626-633.
Li, T-H. and Kedem, B. (1993). Strong consistency
of the contraction mapping method for frequency estimation. IEEE Tr.
Information Theory, 39, 989-998.
Li, T-H. and Kedem, B. (1993). Asymptotic analysis
of a multiple frequency estimation method. Jour. Multivariate Analysis,
46, 214-236.
Kedem, B. and Slud, E. (1994). On autocorrelation
estimation in mixed spectrum Gaussian processes. Stochastic Processes and
Their Applications, 49, 227-244.
Kedem, B. and Troendle, J. (1994). An iterative
filtering algorithm for non-Fourier frequency estimation. Jour. of Time
Series Analysis, 15, 45-63.
Slud, E. and Kedem, B. (1994). Partial likelihood
analysis of logistic regression and autoregression. Statistica Sinica, 4,
89-106.
De Oliveira, V., Kedem, B. and Short, D. (1997).
Bayesian prediction of transformed Gaussian random fields. Journal of the
American Statistical Association}, 92, 1422-1433.
Barnett, J. and Kedem, B. (1998). Zero-crossing
rates of mixtures and products of Gaussian processes. IEEE Tr. Information
Theory}, 44, 1672-1677.
Fokianos, K. and Kedem, B. (1998). Partial
likelihood analysis of categorical time series models (with K. Fokianos.
Jour. Multivariate Analysis, 67, 277-296.
Kozintsev, B. and Kedem, B. (2000). Generation of
"Similar" Images From a Given Discrete Image. Jour. Computational and
Graphical Statistics}, 9, 286-302.
Fokianos, K., Kedem, B., Qin, J., and Short, D.
(2001). A semiparametric approach to the one way layout. Technometrics,
43, 56-65.
Kedem, B. and Fokianos, K. (2002). Regression
Models for Binary Time Series, in "Modeling Uncertainty: An Examination of
Stochastic Theory, Methods, and Applications", M. Dror et al eds., Kluwer,
Boston, 2002, pp. 185-199.
Kedem, B. and Fokianos, K. (2004).
Semiparametric Filtering in Speech
Processing . IMA Volume 138 on ``Mathematical Foundations of Speech
and Language Processing,'' M. Johnson et al eds., Springer-Verlag,
New York, 2004, pp. 271-281.
Fokianos, K. and Kedem, B. (2003).
Regression theory for categorical time
series. Statistical Science, 2003, Vol. 18, 357-376 (2 col. per page).
Fokianos, K. and Kedem, B. (2004). Partial likelihood inference for time
series
following generalized linear models. Jour. of Time Series Analysis,
2004, Vol.
25, 173-197.
Kedem, B., Wolff, D, and Fokianos, K. (2004). Statistical Comparison of
Algorithms. IEEE Tr. on Instrumentation and Measurement, Vol 53,
770-776.